Name: Dual-Head High-Frequency IC Test Probe YF DE1-051DF57-01C0
Brand: SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD.
Price: 999 USD
Availability: InStock

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Dual-Head High-Frequency IC Test Probe YF DE1-051DF57-01C0

Dual-head IC test probe

High-frequency spring test probe

YF DE1 test probe

Lieu d'origine:

Chine

Nom de marque:

WINNER

Certification:

ISO9100

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Dual-Head High-Frequency IC Test Probe YF DE1-051DF57-01C0

Détails de produit

Nom du produit:

sonde d'essai de ressort

baril:

PB, plaqué or

Plongeur inférieur:

BeCu/SK4, plaqué or

Plongeur SUPÉRIEUR:

SK4 (Be Cu)/plaqué or

PRINTEMPS:

SWPB(SUS)/plaqué or

Disponibilité:

Tailles personnalisées disponibles

Revêtement:

Plaqué or

Note actuelle:

Résistance des contacts:

100 Mohm maximum

Bande passante:

-0,85 dB à 19,6 GHz

inductance:

1,27nH

Capacité:

1,62pF

Coup complet:

1,0 mm

Traction nominale:

0,65 mm

Force de ressort:

25 grammes à 0,65 mm

La durée de vie mécanique dépasse:

200K

Mettre en évidence:

Dual-head IC test probe

High-frequency spring test probe

YF DE1 test probe

Conditions de paiement et d'expédition

Quantité de commande min

3000pcs

Prix

999

Détails d'emballage

Emballage neutre ou avec un logo OEM

Délai de livraison

5-8 jours ouvrables

Conditions de paiement

LC, Western Union, T/T

Capacité d'approvisionnement

100000 rouleaux par mois

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Contact maintenant

Description de produit

High Quality Switch Contact Pin Test Probe YF DE1-051DF57-01C0

Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applications, featuring high efficiency BGA testing capabilities.

Key Product Features

High Conductivity Gold Plating: Gold-plated plunger and barrel ensure low contact resistance and stable signal transmission
Multiple Tip Styles: Available in B tip (60° cone), U tip, D tip, and fully customized geometries
Durable Spring Structure: Stainless steel spring (SUS material) provides stable working stroke and reliable contact force
Custom Manufacturing: OEM/ODM accepted with fast delivery from our factory

Product Images

Detailed Component Illustration

Comparison of different test probe tip types and configurations

Customization Options

SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD. offers comprehensive customization for our brass barrel stainless steel spring test probes:

Custom diameters to match your specific requirements
Custom plating thicknesses for optimal conductivity and durability
Custom mechanical specifications tailored to your application

All products include material traceability documentation and certificate of analysis for quality assurance. Contact us to request samples or a quotation for your specific application requirements.

Manufacturing Process

Our probe manufacturing facility

Quality control inspection

Packaged probes ready for shipment

Étiquettes：

Dual-Head High-Frequency IC Test Probe YF DE1-051DF57-01C0

Dual-head IC test probe

High-frequency spring test probe

YF DE1 test probe

Dual-head IC test probe

High-frequency spring test probe

YF DE1 test probe

High Quality Brass Spring Loaded 4 Pin PCB Contact Pin for Electronic Device

Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002

Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for PCB Testing

Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for IC Testing

Électronique en fils de tungstène plaqués or

0R & D sur des fils de tungstène de 0

01 mm